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 TC4011BP/BF/BFN/BFT
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC4011BP,TC4011BF,TC4011BFN,TC4011BFT
TC4011B Quad 2 Input NAND Gate
The TC4011B is 2-input positive logic NAND gate respectively. Since all the outputs of these gates are provided with the inverters as buffers, the input/output characteristics have been improved and the variation of propagation delay time due to the increase in load capacity is kept down to the minimum.
Note: xxxFN (JEDEC SOP) is not available in Japan. TC4011BP
Pin Assignment
A1 B1 X1 X2 B2 A2 VSS
1 2 3 4 5 6 7 (top view)
14 13 12 11 10 9 8
VDD A4 B4 X4 X3 B3 A3
TC4011BF
TC4011BFN
Logic Diagram
X = AB A B X TC4011BFT
Weight DIP14-P-300-2.54 SOP14-P-300-1.27A SOL14-P-150-1.27 TSSOP14-P-0044-0.65A
: 0.96 g (typ.) : 0.18 g (typ.) : 0.12 g (typ.) : 0.06 g (typ.)
1
2007-10-01
TC4011BP/BF/BFN/BFT
Absolute Maximum Ratings (Note)
Characteristics DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating temperature range Storage temperature range Symbol VDD VIN VOUT IIN PD Topr Tstg Rating VSS - 0.5 to VSS + 20 VSS - 0.5 to VDD + 0.5 VSS - 0.5 to VDD + 0.5 10 300 (DIP)/180 (SOIC) -40 to 85 -65 to 150 Unit V V V mA mW C C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Operating Ranges (VSS = 0 V) (Note)
Characteristics DC supply voltage Input voltage Symbol VDD VIN Test Condition Min 3 0 Typ. Max 18 VDD Unit V V
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS.
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TC4011BP/BF/BFN/BFT
Static Electrical Characteristics (VSS = 0 V)
Test Condition Characteristics Symbol VDD (V) |IOUT| < 1 A VIN = VSS, VDD 5 10 15 5 10 15 5 5 10 15 -40C Min 4.95 9.95 14.95 -0.61 -2.50 -1.50 -4.00 Max 0.05 0.05 0.05 Min 4.95 9.95 14.95 -0.51 -2.10 -1.30 -3.40 25C Typ. 5.00 10.00 15.00 0.00 0.00 0.00 -1.0 -4.0 -2.2 -9.0 Max 0.05 0.05 0.05 Min 4.95 9.95 14.95 -0.42 -1.70 -1.10 -2.80 85C Max 0.05 0.05 0.05 mA V V Unit
High-level output voltage
VOH
Low-level output voltage
VOL
|IOUT| < 1 A VIN = VSS, VDD VOH = 4.6 V VOH = 2.5 V
Output high current
IOH
VOH = 9.5 V VOH = 13.5 V VIN = VSS, VDD VOL = 0.4 V
5 10 15
0.61 1.50 4.00

0.51 1.30 3.40
1.2 3.2 12.0

0.42 1.10 2.80
mA
Output low current
IOL
VOL = 0.5 V VOL = 1.5 V VIN = VDD VOUT = 0.5 V
5 10 15
3.5 7.0 11.0

3.5 7.0 11.0
2.75 5.50 8.25

3.5 7.0 11.0
V
Input high voltage
VIH
VOUT = 1.0 V VOUT = 1.5 V |IOUT| < 1 A VOUT = 4.5 V
5 10 15

1.5 3.0 4.0

2.25 4.50 6.75
1.5 3.0 4.0

1.5 3.0 4.0 V
Input low voltage
VIL
VOUT = 9.0 V VOUT = 13.5 V |IOUT| < 1 A
"H" level Input current "L" level Quiescent supply current
IIH IIL
VIH = 18 V VIL = 0 V VIN = VSS, VDD (Note)
18 18 5 10 15

0.1 -0.1 0.25 0.50 1.00

10
-5
0.1 -0.1 0.25 0.50 1.00

1.0 A -1.0 7.5 15.0 30.0 A
-10
-5
0.001 0.001 0.002
IDD
Note: All valid input combinations.
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2007-10-01
TC4011BP/BF/BFN/BFT
Dynamic Electrical Characteristics (Ta = 25C, VSS = 0 V, CL = 50 pF)
Characteristics Symbol Test Condition VDD (V) 5 Output transition time tTLH 10 15 5 Output transition time tTHL 10 15 5 Propagation delay time tpLH 10 15 5 Propagation delay time tpHL 10 15 Input capacitance CIN Min Typ. 70 35 30 70 35 30 65 30 25 65 30 25 5 Max 200 100 80 200 100 80 200 100 80 200 100 80 7.5 pF ns ns ns ns Unit
Circuit and Waveform for Measurement of Dynamic Characteristics
Circuit Waveform
20 ns 20 ns 90% 50% 10%
VDD
Input
90% 50% 10% tTHL 90% 50% 10% tpHL
Output P.G. Input
tTLH 90% 50% 10% tpLH
CL = 50 pF VSS
Output
4
2007-10-01
TC4011BP/BF/BFN/BFT
Package Dimensions
Weight: 0.96 g (typ.)
5
2007-10-01
TC4011BP/BF/BFN/BFT
Package Dimensions
Weight: 0.18 g (typ.)
6
2007-10-01
TC4011BP/BF/BFN/BFT
Package Dimensions (Note)
Note:
This package is not available in Japan.
Weight: 0.12 g (typ.)
7
2007-10-01
TC4011BP/BF/BFN/BFT
Package Dimensions
Weight: 0.06 g (typ.)
8
2007-10-01
TC4011BP/BF/BFN/BFT
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
9
2007-10-01


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